Cosmic-ray soft error rate characterization of a standard 0.6-μm CMOS process. - Peter Hazucha; Christer Svensson; Stephen A. Wender (IEEE J. Solid State Circuits, 2000)

Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam. - Nicolas W. Hengartner; Sarah Ellen Michalak; Bruce E. Takala; Stephen A. Wender (Technometrics, 2008)