Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics. - Patrick M. Lenahan; E. B. Frantz; Sean W. King; Mark A. Anders 002; Stephen J. Moxim; James P. Ashton; Kyle J. Myers; M. E. Flatté; N. J. Harmon (IRPS, 2023)

Detection of Surface Spins Causing Flux Noise in Quantum Devices Using Electron Spin Resonance. - Dustin T. Hassenmayer; Patrick M. Lenahan; Jason T. Ryan; Stephen J. Moxim (QCE, 2025)