Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. - Ian M. Bell; Kevin R. Eckersall; Stephen J. Spinks; Gaynor E. Taylor (ISCAS, 1995)

Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. - Stephen J. Spinks; Chris D. Chalk; Ian M. Bell; Mark Zwolinski (DFT, 1997)

Evaluation and comparison of structural test methodologies for analogue and mixed signal circuits. - Ian M. Bell; Stephen J. Spinks (ICECS, 1998)

Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. - Stephen J. Spinks; Chris D. Chalk; Ian M. Bell; Mark Zwolinski (J. Electron. Test., 2004)