Technology scaling implications for BTI reliability. - Stephen M. Ramey; Chetan Prasad; A. Rahman (Microelectron. Reliab., 2018)

A Physical Unclonable Function Leveraging Hot Carrier Injection Aging. - Rachael J. Parker; Jyothi Bhaskarr Velamala; Kuan-Yueh James Shen; David Johnston; Yao-Feng Chang; Stephen M. Ramey; Siang-jhih Sean Wu; Padma Penmatsa (IRPS, 2023)

The Voltage Dependence of NBTI: Resolution of Controversy Surrounding Power Law vs. Exponential. - Narendra Parihar; Elias Frantz; Misagh Rostami-asrabad; Stephen M. Ramey (IRPS, 2025)