Transistor aging and reliability in 14nm tri-gate technology. - Steven R. Novak; C. Parker; D. Becher; M. Liu; Marty Agostinelli; M. Chahal; P. Packan; P. Nayak; Stephen Ramey; S. Natarajan (IRPS, 2015)

Transistor reliability variation correlation to threshold voltage. - Stephen Ramey; M. Chahal; P. Nayak; Steven R. Novak; Chetan Prasad; Jeffery Hicks (IRPS, 2015)

Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG. - Anisur Rahman; Javier Dacuña; Pinakpani Nayak; Gerald S. Leatherman; Stephen Ramey (IRPS, 2018)

Transistor reliability characterization and modeling of the 22FFL FinFET technology. - Chen-Yi Su; M. Armstrong; Lei Jiang; S. A. Kumar; C. D. Landon; S. Liu; Inanc Meric; K. W. Park; Leif Paulson; K. Phoa; Bernhard Sell; Jihan Standfest; et al. (IRPS, 2018)

A Reliability Overview of Intel's 10+ Logic Technology. - Rohit Grover; Tony Acosta; C. AnDyke; Emre Armagan; C. Auth; Sunny Chugh; K. Downes; M. Hattendorf; N. Jack; S. Joshi; R. Kasim; Gerald S. Leatherman; et al. (IRPS, 2020)

Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes. - Inanc Meric; Stephen Ramey; Steven R. Novak; S. Gupta; S. P. Mudanai; Jeffrey Hicks (IRPS, 2020)

Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology. - Chen-Yi Su; Mark Armstrong; Sunny Chugh; Mohammed El-tanani; Hannes Greve; Hai Li 008; Mahjabin Maksud; Benjamin Orr; Christopher Perini; James Palmer 002; Leif Paulson; Stephen Ramey; et al. (IRPS, 2020)

Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits. - Ketul B. Sutaria; Jihan Standfest; Inanc Meric; Amirhossein H. Davoody; Swaroop Kumar Namalapuri; Trinadh Mutyala; Supriya P.; Balkaran Gill; Stephen Ramey; Jeffery Hicks (IRPS, 2020)

Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies. - Peng Xiao; Haris Hadziosmanovic; Rong Jiang; Misagh Rostami-asrabad; Stephen Ramey; Ilan Tsamaret (IRPS, 2020)

Method to evaluate off-state breakdown in scaled Tri-gate technologies. - D. Nminibapiel; K. Joshi; R. Ramamurthy; L. Pantisano; Inanc Meric; Stephen Ramey (IRPS, 2022)

Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology. - M. Jamil; S. Mukhopadhay; M. Ghoneim; A. Shailos; Chetan Prasad; Inanc Meric; Stephen Ramey (IRPS, 2023)

A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies. - K. Joshi; D. Nminibapiel; M. Ghoneim; D. Ali; R. Ramamurthy; L. Pantisano; Inanc Meric; Stephen Ramey (IRPS, 2023)

A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. - S. Mukhopadhyay; C. Chen; M. Jamil; Jihan Standfest; Inanc Meric; Balkaran Gill; Stephen Ramey (IRPS, 2023)

Hot-Carrier Aging by Ultrafast Laser on 22FLL FinFET Technology. - Ricardo Ascázubi; Bahar Ajdari; Curtis Shirota; Stephen Ramey (IRPS, 2024)