Practical random sampling of potential defects for analog fault simulation. - Stephen Sunter; Krzysztof Jurga; Peter Dingenen; Ronny Vanhooren (ITC, 2014)

Fast BIST of I/O Pin AC specifications and inter-chip delays. - Stephen Sunter; Saghir A. Shaikh; Qing Lin (ITC, 2014)

Efficient Monte Carlo-based analog parametric fault modelling. - Haralampos-G. D. Stratigopoulos; Stephen Sunter (VTS, 2014)

Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics. - Haralampos-G. D. Stratigopoulos; Stephen Sunter (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Special session: Hot topics: Statistical test methods. - Manuel J. Barragán; Gildas Léger; Florence Azaïs; Ronald D. Blanton; Adit D. Singh; Stephen Sunter (VTS, 2015)

Measuring defect tolerance within mixed-signal ICs. - Stephen Sunter; Alessandro Valerio; Riccardo Miglierina (ETS, 2016)

Closing the loop between analog design and test. - Stephen Sunter (ISCAS, 2016)

Automated measurement of defect tolerance in mixed-signal ICs. - Stephen Sunter; Alessandro Valerio; Riccardo Miglierina (ITC, 2016)

Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test. - Stephen Sunter; Krzysztof Jurga; Andrew Laidler (IEEE Trans. Circuits Syst. I Regul. Pap., 2016)

A/MS benchmark circuits for comparing fault simulation, DFT, and test generation methods. - Stephen Sunter; Peter Sarson (ITC, 2017)

Measuring mixed-signal test stimulus quality. - Krzysztof Jurga; Stephen Sunter (ETS, 2018)

IP session on ISO26262 EDA. - Art Schaldenbrand; Yervant Zorian; Stephen Sunter; Peter Sarson (VTS, 2018)

Efficient Analog Defect Simulation. - Stephen Sunter (ITC, 2019)

Analog Fault Simulation - a Hot Topic! - Stephen Sunter (ETS, 2020)

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. - Stephen Sunter; Michal Wolinski; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Nektar Xama; Jhon Gomez; Georges G. E. Gielen (ITC, 2020)

Automated Observability Analysis for Mixed-Signal Circuits. - Stephen Sunter; Krzysztof Jurga (VTS, 2021)

Digital Scan and ATPG for Analog Circuits. - Stephen Sunter; Krzysztof Jurga (ITC, 2024)

A Method for Simulating Mixed-Signal ATE Tests. - Stephen Sunter; Vladimir Zivkovic; Bartlomiej Praselski (VTS, 2024)