Stress, Test, and Simulation of Analog IOs on Automotive ICs. - Chen He; Stephen Traynor; Gayathri Bhagavatheeswaran; Hector Sanchez (ITC, 2020)

Adaptive High Voltage Stress Methodology to Enable Automotive Quality on FinFET Technologies. - Stephen Traynor; Chen He; Y. Y. Yu; Ken Klein (ITC, 2021)

Customizing ATPG User-Defined Stresses and Tests To Target Cell-Neighborhood-Bridging Defects. - Stephen Traynor; Saidapet Ramesh; Maryfe Hernandez; Lawrence Herr; Scott Chen (VTS, 2024)