Germanium channel MOSFETs: Opportunities and challenges. - Huiling Shang; Martin M. Frank; Evgeni P. Gusev; Jack O. Chu; Stephen W. Bedell; Kathryn W. Guarini; Mei-Kei Ieong (IBM J. Res. Dev., 2006)

Materials challenges for III-V/Si co-integrated CMOS. - D. K. Sadana; C.-W. Cheng; B. Wacaser; W. Spratt; K. T. Shiu; Stephen W. Bedell (CICC, 2015)