Direct measurement of residual stress in integrated circuit interconnect features. - Alton B. Horsfall; Joyce M. M. dos Santos; S. M. Soare; Nicholas G. Wright; A. G. O'Neill; Steve J. Bull; Anthony J. Walton; Alan M. Gundlach; J. T. M. Stevenson (Microelectron. Reliab., 2003)

Modelling of contact deformation for a pinch gripper in automated material handling. - Hua Lin; Paul M. Taylor; Steve J. Bull (Math. Comput. Model., 2007)

Characterising gate dielectrics in high mobility devices using novel nanoscale techniques. - Raman Kapoor; Enrique Escobedo-Cousin; S. H. Olsen; Steve J. Bull (Microelectron. Reliab., 2010)