The impact of PMOST bias-temperature degradation on logic circuit reliability performance. - Yung-Huei Lee; Steve Jacobs; Stefan Stadler; Neal R. Mielke; Ramez Nachman (Microelectron. Reliab., 2005)

PMOS NBTI-induced circuit mismatch in advanced technologies. - Marty Agostinelli; Shing Lau; Sangwoo Pae; Phil Marzolf; Harish Muthali; Steve Jacobs (Microelectron. Reliab., 2006)

Exploration of Workflow Management Systems Emerging Features from Users Perspectives. - Ryan Mitchell; Loïc Pottier; Steve Jacobs; Rafael Ferreira da Silva; Mats Rynge; Karan Vahi; Ewa Deelman (IEEE BigData, 2019)

Cyberinfrastructure Center of Excellence Pilot: Connecting Large Facilities Cyberinfrastructure. - Ewa Deelman; Ryan Mitchell; Loïc Pottier; Mats Rynge; Erik Scott; Karan Vahi; Marina Kogan; Jasmine Mann; Tom Gulbransen; Daniel Allen; David Barlow; Anirban Mandal; et al. (eScience, 2019)