Test Reuse at System Level. - José M. Miranda; Scott Davidson 001; Peter Dziel; Saman Adham; Steve Millman (VTS, 1998)

NeuralFP: Out-of-distribution Detection using Fingerprints of Neural Networks. - Wei-Han Lee; Steve Millman; Nirmit Desai; Mudhakar Srivatsa; Changchang Liu (ICPR, 2020)