Multiple quantum well PIN optoelectronic devices and a method of restoring failed device characteristics. - K. Ikossi; William S. Rabinovich; D. Scott Katzer; Steven C. Binari; J. Mittereder; Peter G. Goetz (Microelectron. Reliab., 2002)

Trapping effects in GaN and SiC microwave FETs. - Steven C. Binari; P. B. Klein; Thomas E. Kazior (Proc. IEEE, 2002)