The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA). - William V. Huott; Moyra K. McManus; Daniel R. Knebel; Steve Steen; Dennis Manzer; Pia N. Sanda; Steven C. Wilson; Yuen H. Chan; Antonio Pelella; Stanislav Polonsky (ITC, 1999)

Latchup Analysis Using Emission Microscopy. - Franco Stellari; Peilin Song; Moyra K. McManus; Alan J. Weger; Robert Gauthier 002; Kiran V. Chatty; Mujahid Muhammad; Pia N. Sanda; Philip Wu; Steven C. Wilson (Microelectron. Reliab., 2003)

Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE). - Franco Stellari; Peilin Song; John Hryckowian; Otto A. Torreiter; Steven C. Wilson; Philip Wu; Alberto Tosi (Microelectron. Reliab., 2005)

High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. - Franco Stellari; Peilin Song; Tim Diemoz; Alan J. Weger; Tami Vogel; Steven C. Wilson; John Pennings; Richard F. Rizzolo (ITC, 2006)