Detecting Bridging Faults with Stuck-at Test Sets. - Steven D. Millman; Edward J. McCluskey (ITC, 1988)

Diagnosing CMOS bridging faults with stuck-at fault dictionaries. - Steven D. Millman; Edward J. McCluskey; John M. Acken (ITC, 1990)

Bridging, Transition, and Stuck-Open Faults in Self-Testing CMOS Checkers. - Steven D. Millman; Edward J. McCluskey (FTCS, 1991)

An Accurate Bridging Fault Test Pattern Generator. - Steven D. Millman; James P. Garvey Sr. (ITC, 1991)

Visualizing Test Information: A Novel Approach for Improving Testability. - Jan Moorman; Steven D. Millman (ITC, 1993)

Improving quality: Yield versus test coverage. - Steven D. Millman (J. Electron. Test., 1994)

Special applications of the voting model for bridging faults. - Steven D. Millman; John M. Acken (IEEE J. Solid State Circuits, 1994)