Combining IEEE Standard 1149.1 with reduced-pin-count component test. - Steven F. Oakland (VTS, 1991)

Why Would an ASIC Foundry Accept Anything Less than Full Scan? - Steven F. Oakland (ITC, 1997)

Considerations for implementing IEEE 1149.1 on system-on-a-chip integrated circuits. - Steven F. Oakland (ITC, 2000)

On-Chip Repair and an ATE Independent Fusing Methodology. - Bruce Cowan; Owen Farnsworth; Peter Jakobsen; Steven F. Oakland; Michael Ouellette; Donald L. Wheater (ITC, 2002)

TAPs All Over My Chips. - Steven F. Oakland (ITC, 2002)

An On-Chip Self-Repair Calculation and Fusing Methodology. - Darren Anand; Bruce Cowan; Owen Farnsworth; Peter Jakobsen; Steven F. Oakland; Michael Ouellette; Donald L. Wheater (IEEE Des. Test Comput., 2003)

OCI: Open Compression Interface. - Bruce Cory; Rohit Kapur; Mick Tegethoff; Mark Kassab; Brion L. Keller; Kee Sup Kim; Dwayne Burek; Steven F. Oakland; Benoit Nadeau-Dostie (ITC, 2006)

An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs. - Vikram Iyengar; Kenneth Pichamuthu; Andrew Ferko; Frank Woytowich; David E. Lackey; Gary Grise; Mark Taylor 001; Mike Degregorio; Steven F. Oakland (VTS, 2007)