EASE - An Application-Based CAD System for Process Design. - Jerry Mar; Krish Bhargavan; Steven G. Duvall; Ram Firestone; Dennis J. Lucey; Sharad N. Nandgaonkar; Sheldon Wu; Kaung-Shia Yu; Farshid Zarbakhsh (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1987)

An interchange format for process and device simulation. - Steven G. Duvall (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Practical Statistical Design of Complex Integrated Circuit Products. - Steven G. Duvall (DAC, 1993)

A practical methodology for the statistical design of complex logic products for performance. - Steven G. Duvall (IEEE Trans. Very Large Scale Integr. Syst., 1995)

Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration. - Keith A. Bowman; Steven G. Duvall; James D. Meindl (IEEE J. Solid State Circuits, 2002)

Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage. - Ali Keshavarzi; Gerhard Schrom; Stephen Tang; Sean Ma; Keith A. Bowman; Sunit Tyagi; Kevin Zhang 001; Tom Linton; Nagib Hakim; Steven G. Duvall; John Brews; Vivek De (ISLPED, 2005)

Analysis and Design of Memoryless Interconnect Encoding Scheme. - Ge Chen 008; Steven G. Duvall; Saeid Nooshabadi (ISCAS, 2009)

An optimization strategy for low energy and high performance for the on-chip interconnect signalling. - Ge Chen 008; Saeid Nooshabadi; Steven G. Duvall (ISLPED, 2009)