Practical, non-invasive optical probing for flip-chip devices. - G. Dajee; Norman Goldblatt; Ted R. Lundquist; Steven Kasapi; Keneth R. Wilsher (ITC, 2001)

Overcoming Fault Test Coverage with Time-Resolved Emission (TRE) Probing. - Steven Kasapi; Bruce Cory (Microelectron. Reliab., 2004)

Reduction of the acquisition time for CMOS time-resolved photon emission by optimized IR detection. - Radu Ispasoiu; Tom Crawford; Brian Johnston; Chris Shaw; Steven Kasapi; Jason Goertz; Olivier Rinaudo; Peter Ouimet (Microelectron. Reliab., 2006)

Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. - Ulrike Kindereit; Christian Boit; Uwe Kerst; Steven Kasapi; Radu Ispasoiu; Roy Ng; William K. Lo (Microelectron. Reliab., 2008)

Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing. - Joy Y. Liao; Tung Ton; Nathan Slattengren; Steven Kasapi; William K. Lo; Howard L. Marks; Yin S. Ng; Ted R. Lundquist (Microelectron. Reliab., 2009)

Scan chain failure analysis using laser voltage imaging. - Joy Y. Liao; Steven Kasapi; Bruce Cory; Howard L. Marks; Yin S. Ng (Microelectron. Reliab., 2010)

Foundry workflow for dynamic-EFA-based yield ramp. - Cathy Kardach; I. Kapilevich; Jeffrey A. Block; Ted R. Lundquist; Steven Kasapi; J. Liao; Yin S. Ng; Bruce Cory (Microelectron. Reliab., 2011)