Macro Testability: The Results of Production Device Applications. - Frank Bouwman; Steven Oostdijk; Rudi Stans; Ben Bennetts; Frans P. M. Beenker (ITC, 1992)

Minimizing Test Time by Exploiting Parallelism in Macro Test. - Hans Bouwmeester; Steven Oostdijk; Frank Bouwman; Rudi Stans; Loek Thijssen; Frans P. M. Beenker (ITC, 1993)

Test and debug strategy of the PNX8525 NexperiaTM digital video platform system chip. - Bart Vermeulen; Steven Oostdijk; Frank Bouwman (ITC, 2001)

Test Infrastructure Design for the Nexperia? Home Platform PNX8550 System Chip. - Sandeep Kumar Goel; Kuoshu Chiu; Erik Jan Marinissen; Toan Nguyen; Steven Oostdijk (DATE, 2004)