Testability features of the first-generation CELL processor. - Mack W. Riley; Louis B. Bushard; Nathan Paul Chelstrom; Naoki Kiryu; Steven Ross Ferguson (ITC, 2005)

DFT of the Cell Processor and its Impact on EDA Test Softwar. - Louis Bushard; Nathan Chelstrom; Steven Ross Ferguson; Brion Keller (ATS, 2006)