From Emergence to Prevalence: 22FDX® Embedded STT-MRAM. - Johannes Müller; Aleksandra Titova; Hongsik Yoon; Thomas Merbeth; Martin Weisheit; Georg Wolf; Sanjeeb Bharali; Bert Pfefferling; Yuichi Otani; Tetyana Shapoval; Alberto Cagliani; Ferenc Vajda; et al. (IMW, 2022)

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. - Vinayak Bharat Naik; J. H. Lim; Kazutaka Yamane; J. Kwon; Behin-Aein B.; N. L. Chung; S. K 001; R. Chao; C. Chiang; Y. Huang; L. Pu; Yuichi Otani; et al. (IRPS, 2022)

Asymmetric Double-Gate Ferroelectric FET to Decouple the Tradeoff Between Thickness Scaling and Memory Window. - Zhouhang Jiang; Yi Xiao 008; Swetaki Chatterjee; Halid Mulaosmanovic; Stefan Dünkel; Steven Soss; Sven Beyer; Rajiv V. Joshi; Yogesh Singh Chauhan; Hussam Amrouch; Vijaykrishnan Narayanan; Kai Ni 004 (VLSI Technology and Circuits, 2022)

Charge trapping challenges of CMOS embedded complementary FeFETs. - Sven Beyer; Dominik Kleimaier; Stefan Dünkel; Halid Mulaosmanovic; Steven Soss; Johannes Müller; Zhouhang Jiang; Kai Ni 004; Thomas Mikolajick; Haidi Zhou (IMW, 2024)

Paving the Way for Pass Disturb Free Vertical NAND Storage via A Dedicated and String-Compatible Pass Gate. - Zijian Zhao 001; Sola Woo; Khandker Akif Aabrar; Sharadindu Gopal Kirtania; Zhouhang Jiang; Shan Deng; Yi Xiao 008; Halid Mulaosmanovic; Stefan Dünkel; Dominik Kleimaier; Steven Soss; Sven Beyer; et al. (CoRR, 2024)

Optimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance. - Vinayak Bharat Naik; Gregory Billus; Amit Kumar Shukla; Andre Vogel; Veit Kriegerstein; Patrick Scharf; Venkata Siva Komma; Johannes Mueller; Thomas Merbeth; Ralf Flemming; Ingolf Lorenz; Muthu Kumaran Nambi; et al. (ETS, 2025)