Well-Charging Damage to Capacitors Connected Between VDD and VSS in a Single Power Domain. - Hsi-Yu Kuo; Yu-Lin Chu; Chien-Jen Wang; Steven Sze Hang Poon; Chun-Wei Yao; Hsuan Chu; Yi-Ching Chen; Yi-Lun Chen; Yu-Ti Su; Chia-Lin Hsu; Tsung-Yuan Chen; Te-Liang Li; et al. (IRPS, 2025)