Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics. - Gang Niu 002; Satnam Singh; Steven W. Holland; Michael G. Pecht (Microelectron. Reliab., 2011)

Decision Forest for Root Cause Analysis of Intermittent Faults. - Satnam Singh; Halasya Siva Subramania; Steven W. Holland; Jason T. Davis (IEEE Trans. Syst. Man Cybern. Part C, 2012)