Key measurements of ultrathin gate dielectric reliability and in-line monitoring. - W. W. (Bill) Abadeer; Asmik Bagramian; David W. Conkle; Charles W. Griffin; Eric D. Langlois 001; Brian F. Lloyd; Raymond P. Mallette; James E. Massucco; Jonathan M. McKenna; Steven W. Mittl; Philip H. Noel (IBM J. Res. Dev., 1999)

A novel CMOS compatible embedded nonvolatile memory with zero process adder. - Matthew J. Breitwisch; Chung Hon Lam; Jeffrey B. Johnson; Steven W. Mittl; Jian W. Zhu (MTDT, 2005)

Self-heating and its implications on hot carrier reliability evaluations. - Steven W. Mittl; Fernando Guarin (IRPS, 2015)