Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies. - Giuseppe La Rosa; Stewart E. Rauch III (Microelectron. Reliab., 2007)

A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs. - Prateek Sharma; Stanislav Tyaginov; Stewart E. Rauch; Jacopo Franco; Ben Kaczer; Alexander Makarov; Mikhail I. Vexler; Tibor Grasser (ESSDERC, 2016)

Self-heating characterization and its applications in technology development. - Peter C. Paliwoda; Maria Toledano-Luque; Tanya Nigam; Fernando Guarin; M. Nour; S. Cimino; L. Pantisano; A. Gupta; Oscar Huerta-Gonzalez; M. Hauser; W. Liu; A. Vayshenker; et al. (NATW, 2020)

Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. - Stewart E. Rauch; Dongho Lee; Alexey Vert; Roy Gupta (NATW, 2020)

Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics. - Stewart E. Rauch; Dongho Lee; Alexey Vert; Lin Jiang; Byoung Min (OFC, 2020)