A language for describing boundary scan devices. - Kenneth P. Parker; Stig Oresjo (J. Electron. Test., 1991)

Structure and Metrology for an Analog Testability Bus. - Kenneth P. Parker; John E. McDermid; Stig Oresjo (ITC, 1993)

Unpowered Opens Test with X-Ray Laminography. - Stig Oresjo (ITC, 1997)