Gate-All-Around SRAM: Performance Investigation and Optimization Towards Vccmin Scaling. - Pratik B. Vyas; Ashish Pal; Gregory Costrini; Benjamin Colombeau; Bala Haran; Subi Kengeri; El Mehdi Bazizi (IMW, 2024)

Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology. - Leitao Liu; Jingtian Fang; Ashish Pal; Plamen Asenov; Mohit Bajaj; Bei Deng; Xi-Wei Lin; Souvik Mahapatra; Subi Kengeri; El Mehdi Bazizi (IRPS, 2024)

Material, Process and System Level Analysis for Parasitic Reduction of Next Generation Logic Technology in Conjunction with Backside Power Delivery. - Ashish Pal; Sefa Dag; Pratik B. Vyas; Gregory Costrini; Vinod Reddy; Veeraraghavan Basker; Allen Yeong; Benjamin Colombeau; Bala Haran; Subi Kengeri; El Mehdi Bazizi (VLSI Technology and Circuits, 2024)

Novel Material, Process and Device Innovations for Next Generation Silicon Carbide (SiC) Trench MOSFET Technology. - Pratik B. Vyas; Ludovico Megalini; Ashish Pal; Joshua Holt; Archana Kumar; Stephen Weeks; Charisse Zhao; Lucien Date; Hansel Lo; Michel Khoury; Safdar Muhammad; Fabian Piallat; et al. (VLSI Technology and Circuits, 2024)