Achieving High Test Quality with Reduced Pin Count Testing. - Jay Jahangiri; Nilanjan Mukherjee 001; Wu-Tung Cheng; Subramanian Mahadevan; Ron Press (Asian Test Symposium, 2005)

High Test Quality in Low Pin Count Applications. - Jayant D'Souza; Subramanian Mahadevan; Nilanjan Mukherjee 001; Graham Rhodes; Jocelyn Moreau; Thomas Droniou; Paul Armagnat; Damien Sartoretti (ITC, 2008)

Deterministic In-Fleet Scan Test for a Cloud Computing Platform. - Dan Trock; Subramanian Mahadevan; Nilanjan Mukherjee 001; Lee Harrison; Janusz Rajski; Jerzy Tyszer (ITC, 2024)