Thickness and temperature dependence of the leakage current in hafnium-based Si SOI MOSFETs. - Jiseok Kim; Siddarth A. Krishnan; Sudarshan Narayanan; Michael P. Chudzik; Massimo V. Fischetti (Microelectron. Reliab., 2012)

Optimization of the interconnect resistance contribution for STT-MRAM technology. - Hemant Dixit; Sudarshan Narayanan; Bert Pfefferling; Johannes Mueller (Microelectron. J., 2020)

Combating the spread of fake news on social media through a blockchain-led intervention. - Sudarshan Narayanan; V S. Prakash Attili (AMCIS, 2021)