Efficient test scheduling for reusable BIST in 3D stacked ICs. - Navya Mohan; Maya Krishnan; Sudhir Kumar Rai; M. MathuMeitha; S. Sivakalyan (ICACCI, 2017)

A Node-Embedding Features Based Machine Learning Technique for Dynamic Malware Detection. - Sudhir Kumar Rai; Ashish Mittal; Sparsh Mittal (DSC, 2022)