Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM. - Michael Redeker; Bruce F. Cockburn; Duncan G. Elliott; Yunan Xiang; Sue Ann Ung (MTDT, 2002)

Test and Characterization of a Variable-Capacity Multilevel DRAM. - John C. Koob; Sue Ann Ung; Ashwin S. Rao; Daniel A. Leder; Craig S. Joly; Kristopher C. Breen; Tyler L. Brandon; Michael Hume; Bruce F. Cockburn; Duncan G. Elliott (VTS, 2005)

Design and Characterization of a Multilevel DRAM. - John C. Koob; Sue Ann Ung; Bruce F. Cockburn; Duncan G. Elliott (IEEE Trans. Very Large Scale Integr. Syst., 2011)