Hardening silicon-on-insulator nMOSFETs by multiple-step Si+ implantation. - Huixiang Huang; Yanyan Huang; Jiachun Zheng; Sufen Wei; Kai Tang; Dawei Bi; Zhengxuan Zhang (Microelectron. Reliab., 2016)

A Physical Threshold Voltage Model of Nanoscale Ultra-thin Body Ultra-thin Box SOI MOSFETs with a Gaussian Doping Profile. - Hongxia Chen; Sufen Wei; Jing Liu; Guohe Zhang; Cheng-Fu Yang (ICKII, 2019)