Estimation of Contamination Level of Overhead Insulators Based on Surface Leakage Current Employing Detrended Fluctuation Analysis. - Suhas Deb; Santanu Das; Arpan Kumar Pradhan; Apu Banik; Biswendu Chatterjee; Sovan Dalai (IEEE Trans. Ind. Electron., 2020)

Convolutional neural network and Bi-directional long short memory hybrid deep network aided infrared image classification framework for non-contact monitoring of overhead insulators. - Arup Kumar Das; Suhas Deb; Soumya Chatterjee 001; Biswendu Chatterjee; Sovan Dalai (IET Signal Process., 2022)