Empirical Sensitivity Analysis of Discretization Parameters for Fault Pattern Extraction From Multivariate Time Series Data. - Sujeong Baek; Duck Young Kim (IEEE Trans. Cybern., 2017)

Characterization of System Status Signals for Multivariate Time Series Discretization Based on Frequency and Amplitude Variation. - Woonsang Baek; Sujeong Baek; Duck Young Kim (Sensors, 2018)

Abrupt variance and discernibility analyses of multi-sensor signals for fault pattern extraction. - Sujeong Baek; Duck Young Kim (Comput. Ind. Eng., 2019)

Fault Prediction via Symptom Pattern Extraction Using the Discretized State Vectors of Multisensor Signals. - Sujeong Baek; Duck Young Kim (IEEE Trans. Ind. Informatics, 2019)

A modular factory testbed for the rapid reconfiguration of manufacturing systems. - Duck Young Kim; Jin Woo Park; Sujeong Baek; K.-B. Park; H.-R. Kim; J.-I. Park; H.-S. Kim; B.-B. Kim; H.-Y. Oh; Kichang Namgung; Woonsang Baek (J. Intell. Manuf., 2020)

Estimating System State through Similarity Analysis of Signal Patterns. - Kichang Namgung; Hyunsik Yoon; Sujeong Baek; Duck Young Kim (Sensors, 2020)

Abrupt covariance based signal extraction for fault prediction of an aircraft engine. - Sujeong Baek; Yong-Uk Song (SNPD Winter, 2021)

Multiple Operational Status Classification Based on One-Versus-One SVM in FDM 3D Printer. - Yebon Lee; Sujeong Baek (APMS (1), 2022)

Fault Detection in Automatic Manufacturing Processes via 2D Image Analysis Using a Combined CNN-LSTM Model. - Na Hyeon Yu; Sujeong Baek (APMS (1), 2022)