A Methodology for Solving Problems in Artificial Intelligence (Automated Reasoning, Heuristics, A-Star Algorithm, Model Problem). - Suk In Yoo (1985)

Automatic Detection of Region-Mura Defect in TFT-LCD. - Jae Yeong Lee; Suk In Yoo (IEICE Trans. Inf. Syst., 2004)

Image Restoration for Quantifying TFT-LCD Defect Levels. - Kyu Nam Choi; No Kap Park; Suk In Yoo (IEICE Trans. Inf. Syst., 2008)

Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception. - No Kap Park; Suk In Yoo (J. Electronic Imaging, 2008)

Evaluation of TFT-LCD defects based on human visual perception. - No Kap Park; Suk In Yoo (Displays, 2009)