Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM). - Hyunui Lee; Sukyong Kang; Hye-Seung Yu; Won-Joo Yun; Jae-Hun Jung; Sungoh Ahn; Wang-Soo Kim; Beomyong Kil; Yoo-Chang Sung; Sang-Hoon Shin; Yong-Sik Park; Yong-Hwan Kim; et al. (A-SSCC, 2016)