Low-Cost Test for Large Analog IC's. - Sule Ozev; Alex Orailoglu (DFT, 1999)

Test Synthesis for Mixed-Signal SOC Paths. - Sule Ozev; Ismet Bayraktaroglu; Alex Orailoglu (DATE, 2000)

Block-Based Test Integration for Analog Integrated Circuits. - Sule Ozev; Alex Orailoglu (LATW, 2000)

Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems. - Sule Ozev; Alex Orailoglu (VTS, 2000)

Testability implications in low-cost integrated radio transceivers: a Bluetooth case study. - Christian Olgaard; Sule Ozev; Alex Orailoglu (ITC, 2001)

Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits. - Sule Ozev; Alex Orailoglu (ICCD, 2002)

Automated test development and test time reduction for RF subsystems. - Sule Ozev; Alex Orailoglu; Hosam Haggag (ISCAS (1), 2002)

An Integrated Tool for Analog Test Generation and Fault Simulation. - Sule Ozev; Alex Orailoglu (ISQED, 2002)

Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis. - Sule Ozev; Alex Orailoglu (VTS, 2002)

Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers. - Sule Ozev; Christian Olgaard; Alex Orailoglu (IEEE Des. Test Comput., 2002)

TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers. - Anuja Sehgal; Sule Ozev; Krishnendu Chakrabarty (ICCAD, 2003)

Testing of Droplet-Based Microelectrofluidic Systems. - Fei Su; Sule Ozev; Krishnendu Chakrabarty (ITC, 2003)

Statistical Tolerance Analysis for Assured Analog Test Coverage. - Sule Ozev; Alex Orailoglu (J. Electron. Test., 2003)

Tolerating Hard Faults in Microprocessor Array Structures. - Fred A. Bower; Paul G. Shealy; Sule Ozev; Daniel J. Sorin (DSN, 2004)

Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. - Fang Liu 029; Sule Ozev; Martin A. Brooke (ICCAD, 2004)

End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths. - Sule Ozev; Alex Orailoglu (ICCD, 2004)

Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. - Erkan Acar; Sule Ozev (ITC, 2004)

Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. - Sule Ozev; Christian Olgaard (VTS, 2004)

Seamless Test of Digital Components in Mixed-Signal Paths. - Sule Ozev; Ismet Bayraktaroglu; Alex Orailoglu (IEEE Des. Test Comput., 2004)

Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead. - Sule Ozev; Alex Orailoglu (IEEE Trans. Very Large Scale Integr. Syst., 2004)

Hierarchical analysis of process variation for mixed-signal systems. - Fang Liu 029; Sule Ozev (ASP-DAC, 2005)

Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. - Jonathan R. Carter; Sule Ozev; Daniel J. Sorin (DATE, 2005)

Hierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing. - Fang Liu 029; Jacob J. Flomenberg; Devaka V. Yasaratne; Sule Ozev (DATE, 2005)

Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. - Anuja Sehgal; Fang Liu 029; Sule Ozev; Krishnendu Chakrabarty (DATE, 2005)

Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. - Erkan Acar; Sule Ozev (ICCAD, 2005)

Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits. - Fang Liu 029; Sule Ozev (ICCD, 2005)

A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs. - Anuja Sehgal; Sule Ozev; Krishnendu Chakrabarty (ICCD, 2005)

Defect-based RF testing using a new catastrophic fault model. - Erkan Acar; Sule Ozev (ITC, 2005)

A Mechanism for Online Diagnosis of Hard Faults in Microprocessors. - Fred A. Bower; Daniel J. Sorin; Sule Ozev (MICRO, 2005)

Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. - Erkan Acar; Sule Ozev (VTS, 2005)

Autonomic Microprocessor Execution via Self-Repairing Arrays. - Fred A. Bower; Sule Ozev; Daniel J. Sorin (IEEE Trans. Dependable Secur. Comput., 2005)

Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. - Erkan Acar; Sule Ozev; Kevin B. Redmond (ICCAD, 2006)

Efficient Testing of RF MIMO Transceivers Used in WLAN Applications. - Erkan Acar; Sule Ozev (ICCD, 2006)

A Robust, Self-Tuning CMOS Circuit for Built-in Go/No-Go Testing of Synthesizer Phase Noise. - Erdem Serkan Erdogan; Sule Ozev (ITC, 2006)

Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier. - Mahmut Yilmaz; Derek Hower; Sule Ozev; Daniel J. Sorin (ITC, 2006)

Applying architectural vulnerability Analysis to hard faults in the microprocessor. - Fred A. Bower; Derek Hower; Mahmut Yilmaz; Daniel J. Sorin; Sule Ozev (SIGMETRICS/Performance, 2006)

Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework. - Fang Liu 029; Plamen K. Nikolov; Sule Ozev (VTS, 2006)

Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems. - Fei Su; Sule Ozev; Krishnendu Chakrabarty (J. Electron. Test., 2006)

Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements. - Fang Liu 029; Sule Ozev; Martin A. Brooke (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)

Concurrent testing of digital microfluidics-based biochips. - Fei Su; Sule Ozev; Krishnendu Chakrabarty (ACM Trans. Design Autom. Electr. Syst., 2006)

Test infrastructure design for mixed-signal SOCs with wrapped analog cores. - Anuja Sehgal; Sule Ozev; Krishnendu Chakrabarty (IEEE Trans. Very Large Scale Integr. Syst., 2006)

Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation. - Bogdan F. Romanescu; Michael E. Bauer; Daniel J. Sorin; Sule Ozev (PACT, 2007)

AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. - Sudarshan Bahukudumbi; Sule Ozev; Krishnendu Chakrabarty; Vikram Iyengar (ASP-DAC, 2007)

An ADC-BiST scheme using sequential code analysis. - Erdem Serkan Erdogan; Sule Ozev (DATE, 2007)

Lazy Error Detection for Microprocessor Functional Units. - Mahmut Yilmaz; Albert Meixner; Sule Ozev; Daniel J. Sorin (DFT, 2007)

Digital calibration of RF transceivers for I-Q imbalances and nonlinearity. - Erkan Acar; Sule Ozev (ICCD, 2007)

Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. - Sule Ozev; Daniel J. Sorin; Mahmut Yilmaz (ICCD, 2007)

Low cost characterization of RF transceivers through IQ data analysis. - Erkan Acar; Sule Ozev (ITC, 2007)

Test yield estimation for analog/RF circuits over multiple correlated measurements. - Fang Liu 029; Erkan Acar; Sule Ozev (ITC, 2007)

Efficient simulation of parametric faults for multi-stage analog circuits. - Fang Liu 029; Sule Ozev (ITC, 2007)

A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up. - Erkan Acar; Sule Ozev; Kevin B. Redmond (VTS, 2007)

VariaSim: simulating circuits and systems in the presence of process variability. - Bogdan F. Romanescu; Michael E. Bauer; Sule Ozev; Daniel J. Sorin (SIGARCH Comput. Archit. News, 2007)

Online diagnosis of hard faults in microprocessors. - Fred A. Bower; Daniel J. Sorin; Sule Ozev (ACM Trans. Archit. Code Optim., 2007)

Statistical Test Development for Analog Circuits Under High Process Variations. - Fang Liu 029; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007)

Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup. - Erkan Acar; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2007)

Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching. - Bogdan F. Romanescu; Michael E. Bauer; Sule Ozev; Daniel J. Sorin (Conf. Computing Frontiers, 2008)

Dynamic test scheduling for analog circuits for improved test quality. - Ender Yilmaz; Sule Ozev (ICCD, 2008)

Diagnosis of assembly failures for System-in-Package RF tuners. - Erdem Serkan Erdogan; Sule Ozev; Philippe Cauvet (ISCAS, 2008)

Optimized EVM Testing for IEEE 802.11a/n RF ICs. - Erkan Acar; Sule Ozev; Ganesh Srinivasan; Friedrich Taenzler (ITC, 2008)

Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers. - Erdem Serkan Erdogan; Sule Ozev (VTS, 2008)

Defect-Oriented Testing of RF Circuits. - Erkan Acar; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling. - Fang Liu 029; Sule Ozev; Plamen K. Nikolov (ACM Trans. Design Autom. Electr. Syst., 2008)

Adaptive test elimination for analog/RF circuits. - Ender Yilmaz; Sule Ozev (DAC, 2009)

Defect Filter for Alternate RF Test. - Haralampos-G. D. Stratigopoulos; Salvador Mir; Erkan Acar; Sule Ozev (ETS, 2009)

Defect-based test optimization for analog/RF circuits for near-zero DPPM applications. - Ender Yilmaz; Sule Ozev (ICCD, 2009)

Built-in EVM measurement for OFDM transceivers using all-digital DFT. - Ender Yilmaz; Afsaneh Nassery; Sule Ozev; Erkan Acar (ITC, 2009)

A Packet Based 2x-Site Test Solution for GSM Transceivers with Limited Tester Resources. - Erdem Serkan Erdogan; Sule Ozev (VTS, 2009)

Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis. - Erkan Acar; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Wafer-Level Defect Screening for "Big-D/Small-A" Mixed-Signal SoCs. - Sudarshan Bahukudumbi; Sule Ozev; Krishnendu Chakrabarty; Vikram Iyengar (IEEE Trans. Very Large Scale Integr. Syst., 2009)

Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. - Ender Yilmaz; Sule Ozev; Kenneth M. Butler (ITC, 2010)

Low Cost MIMO Testing for RF Integrated Circuits. - Erkan Acar; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST. - Erdem Serkan Erdogan; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Extraction of EVM from Transmitter System Parameters. - Afsaneh Nassery; Sule Ozev; Marian Verhelst; Mustapha Slamani (ETS, 2011)

Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study. - Ramachandran Venkatasubramanian; Doohwang Chang; Sule Ozev (ETS, 2011)

Fast and Accurate DPPM Computation Using Model Based Filtering. - Ender Yilmaz; Sule Ozev (ETS, 2011)

Adaptive multidimensional outlier analysis for analog and mixed signal circuits. - Ender Yilmaz; Sule Ozev; Kenneth M. Butler (ITC, 2011)

An industrial case study of analog fault modeling. - Ender Yilmaz; Anne Meixner; Sule Ozev (VTS, 2011)

Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response Evaluation. - Gurusubrahmaniyan Subrahmaniyan Radhakrishnan; Sule Ozev (J. Electron. Test., 2011)

A Multi-Site Test Solution for Quadrature Modulation RF Transceivers. - Erdem Serkan Erdogan; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

An analytical technique for characterization of transceiver IQ imbalances in the loop-back mode. - Afsaneh Nassery; Sule Ozev (DATE, 2012)

Adaptive testing of chips with varying distributions of unknown response bits. - Chandra K. H. Suresh; Ozgur Sinanoglu; Sule Ozev (ETS, 2012)

Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. - Ender Yilmaz; Sule Ozev (ETS, 2012)

Adaptive testing: Conquering process variations. - Ender Yilmaz; Sule Ozev; Ozgur Sinanoglu; Peter C. Maxwell (ETS, 2012)

Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector. - Afsaneh Nassery; Srinath Byregowda; Sule Ozev; Marian Verhelst; Mustapha Slamani (VTS, 2012)

Test Signal Development and Analysis for OFDM Systems RF Front-End Parameter Extraction. - Afsaneh Nassery; Osman Emir Erol; Sule Ozev; Marian Verhelst (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Test Application for Analog/RF Circuits With Low Computational Burden. - Ender Yilmaz; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Electrical calibration of spring-mass MEMS capacitive accelerometers. - Lingfei Deng; Vinay Kundur; Naveen Sai Jangala Naga; Muhlis Kenan Ozel; Ender Yilmaz; Sule Ozev; Bertan Bakkaloglu; Sayfe Kiaei; Divya Pratab; Tehmoor Dar (DATE, 2013)

Adaptive reduction of the frequency search space for multi-vdd digital circuits. - Chandra K. H. Suresh; Ender Yilmaz; Sule Ozev; Ozgur Sinanoglu (DATE, 2013)

Fault analysis and simulation of large scale industrial mixed-signal circuits. - Ender Yilmaz; Geoff Shofner; LeRoy Winemberg; Sule Ozev (DATE, 2013)

Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion. - Afsaneh Nassery; Sule Ozev; Mustapha Slamani (ETS, 2013)

Adaptive quality binning for analog circuits. - Ender Yilmaz; Sule Ozev; Kenneth M. Butler (ETS, 2013)

Zero-overhead self test and calibration of RF transceivers. - Afsaneh Nassery; Jae Woong Jeong; Sule Ozev (ITC, 2013)

Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters. - Jae Woong Jeong; Sule Ozev; Shreyas Sen; T. M. Mak (VTS, 2013)

Efficient Process Shift Detection and Test Realignment. - Ender Yilmaz; Sule Ozev; Kenneth M. Butler (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring. - Ender Yilmaz; Sule Ozev; Kenneth M. Butler (IEEE Trans. Very Large Scale Integr. Syst., 2013)

Approximating the age of RF/analog circuits through re-characterization and statistical estimation. - Doohwang Chang; Sule Ozev; Ozgur Sinanoglu; Ramesh Karri (DATE, 2014)

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. - Jae Woong Jeong; Sule Ozev; Shreyas Sen; Vishwanath Natarajan; Mustapha Slamani (DATE, 2014)

Reliability enhancement using in-field monitoring and recovery for RF circuits. - Doohwang Chang; Sule Ozev; Bertan Bakkaloglu; Sayfe Kiaei; Engin Afacan; Günhan Dündar (VTS, 2014)

Development and empirical verification of an accuracy model for the power down leakage tests. - Jae Woong Jeong; Sule Ozev; Friedrich Taenzler; Hui-Chuan Chao (VTS, 2014)

A built-in self-test technique for load inductance and lossless current sensing of DC-DC converters. - Tao Liu; Chao Fu; Sule Ozev; Bertan Bakkaloglu (VTS, 2014)

Special session 4B: Panel: Testing and calibration for power management circuits. - Sule Ozev; Bertan Bakkaloglu (VTS, 2014)

Built-In EVM Measurement With Negligible Hardware Overhead. - Ender Yilmaz; Afsaneh Nassery; Sule Ozev (IEEE Des. Test, 2014)

On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC. - Osman Emir Erol; Sule Ozev; Chandra K. H. Suresh; Rubin A. Parekhji; Lakshmanan Balasubramanian (DATE, 2015)

Robust amplitude measurement for RF BIST applications. - Jae Woong Jeong; Jennifer Kitchen; Sule Ozev (ETS, 2015)

A self-compensating built-in self-test solution for RF phased array mismatch. - Jae Woong Jeong; Jennifer Kitchen; Sule Ozev (ITC, 2015)

Disturbance-free BIST for loop characterization of DC-DC buck converters. - Navankur Beohar; Priyanka Bakliwal; Sidhanto Roy; Debashis Mandal; Philippe Adell; Bert Vermeire; Bertan Bakkaloglu; Sule Ozev (VTS, 2015)

Enabling unauthorized RF transmission below noise floor with no detectable impact on primary communication performance. - Doohwang Chang; Bertan Bakkaloglu; Sule Ozev (VTS, 2015)

Panel: Analog/RF BIST: Are we there yet? - Sule Ozev; Linda Milor (VTS, 2015)

Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation. - Ender Yilmaz; Sule Ozev (IEEE Des. Test, 2015)

Adaptive Generation of Unique IDs for Digital Chips through Analog Excitation. - Chandra K. H. Suresh; Sule Ozev; Ozgur Sinanoglu (ACM Trans. Design Autom. Electr. Syst., 2015)

Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector. - Afsaneh Nassery; Srinath Byregowda; Sule Ozev; Marian Verhelst; Mustapha Slamani (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Multi-objective design optimization for flexible hybrid electronics. - Ganapati Bhat; Ujjwal Gupta; Nicholas Tran; Jaehyun Park 005; Sule Ozev; Ümit Y. Ogras (ICCAD, 2016)

Post-production adaptation of RF circuits for application-specific performance metrics. - Doohwang Chang; Jennifer Kitchen; Sule Ozev (ISCAS, 2016)

Detection of malicious hardware components in mobile platforms. - Fatih Karabacak; Ümit Y. Ogras; Sule Ozev (ISQED, 2016)

Making unreliable Chem-FET sensors smart via soft calibration. - Fatih Karabacak; Uwadiae Obahiagbon; Ümit Y. Ogras; Sule Ozev; Jennifer Blain Christen (ISQED, 2016)

Process independent gain measurement with low overhead via BIST/DUT co-design. - Jae Woong Jeong; Jennifer Kitchen; Sule Ozev (VTS, 2016)

Rail Clamp with Dynamic Time-Constant Adjustment. - Ramachandran Venkatasubramanian; Kent Oertle; Sule Ozev (IEEE J. Solid State Circuits, 2016)

Adapting to Varying Distribution of Unknown Response Bits. - Chandra K. H. Suresh; Ozgur Sinanoglu; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2016)

Process Independent Design Methodology for the Active RC and Single-Inverter-Based Rail Clamp. - Ramachandran Venkatasubramanian; Robert Elio; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2016)

Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits. - Doohwang Chang; Jennifer N. Kitchen; Bertan Bakkaloglu; Sayfe Kiaei; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers. - Jae Woong Jeong; Afsaneh Nassery; Jennifer N. Kitchen; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2016)

A Comparator-Based Rail Clamp. - Ramachandran Venkatasubramanian; Kent Oertle; Sule Ozev (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Remote detection of unauthorized activity via spectral analysis: work-in-progress. - Fatih Karabacak; Ümit Y. Ogras; Sule Ozev (CODES+ISSS, 2017)

Contact-less near-field measurement of RF phased array antenna mismatches. - Maryam Shafiee; Sule Ozev (ETS, 2017)

Receiver echo cancellation with real-time self calibration for passive implanted neuron recorders. - Maryam Shafiee; Sule Ozev (ISCAS, 2017)

Evaluation of loop transfer function based dynamic testing of LDOs. - Mehmet Ince; Ender Yilmaz; Jae Woong Jeong; LeRoy Winemberg; Sule Ozev (ITC-Asia, 2017)

Built-in self-test for stability measurement of low dropout regulator. - Jae Woong Jeong; Ender Yilmaz; LeRoy Winemberg; Sule Ozev (ITC, 2017)

Statistical library characterization using arbitrary polynomial chaos. - Mehmet Ince; Sule Ozev; Sarma B. K. Vrudhula (LASCAS, 2017)

Adaptive Reduction of the Frequency Search Space for Multi-Vdd Digital Circuits Using Variation Sensitive Ring Oscillators. - Chandra K. H. Suresh; Sule Ozev; Ozgur Sinanoglu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017)

A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources. - Jae Woong Jeong; Vishwanath Natarajan; Shreyas Sen; T. M. Mak; Jennifer Kitchen; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2017)

Enabling fast process variation and fault simulation through macromodelling of analog components. - Mehmet Ince; Ender Yilmaz; Sule Ozev (NATW, 2018)

RF circuit authentication for detection of process Trojans. - Fatih Karabacak; Richard Welker; Matthew J. Casto; Jennifer N. Kitchen; Sule Ozev (VTS, 2018)

Online information utility assessment for per-device adaptive test flow. - Yanjun Li; Ender Yilmaz; Peter Sarson; Sule Ozev (VTS, 2018)

A built-in self-test technique for transmitter-only systems. - Maryam Shafiee; Jennifer N. Kitchen; Sule Ozev (VTS, 2018)

Special session on BIST/calibration of A/MS devices. - Hans-Mart von Staudt; James Izon; Sule Ozev; Peter Sarson (VTS, 2018)

Online Built-In Self-Test of High Switching Frequency DC-DC Converters Using Model Reference Based System Identification Techniques. - Navankur Beohar; Venkata N. K. Malladi; Debashis Mandal; Sule Ozev; Bertan Bakkaloglu (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

Detection Mechanisms for Unauthorized Wireless Transmissions. - Doohwang Chang; Ganapati Bhat; Ümit Y. Ogras; Bertan Bakkaloglu; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2018)

Remote Detection of Unauthorized Activity via Spectral Analysis. - Fatih Karabacak; Ümit Y. Ogras; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2018)

A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters. - Maryam Shafiee; Navankur Beohar; Priyanka Bakliwal; Sidhanto Roy; Debashis Mandal; Bertan Bakkaloglu; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2018)

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. - Mehmet Ince; Ender Yilmaz; Wei Fu; Joonsung Park; Krishnaswamy Nagaraj; LeRoy Winemberg; Sule Ozev (ETS, 2019)

Detecting Gas Vapor Leaks through Uncalibrated Sensor Based CPS. - Diaa Badawi; Sule Ozev; Jennifer Blain Christen; Chengmo Yang; Alex Orailoglu; A. Enis Çetin (ICASSP, 2019)

Optimized Stress Testing for Flexible Hybrid Electronics Designs. - Hang Gao; Ganapati Bhat; Ümit Y. Ogras; Sule Ozev (VTS, 2019)

PCB Hardware Trojans: Attack Modes and Detection Strategies. - Matthew McGuire; Ümit Y. Ogras; Sule Ozev (VTS, 2019)

Detecting Gas Vapor Leaks Using Uncalibrated Sensors. - Diaa Badawi; Tuba Ayhan; Sule Ozev; Chengmo Yang; Alex Orailoglu; Ahmet Enis Çetin (IEEE Access, 2019)

On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration. - Jae Woong Jeong; Jennifer Kitchen; Sule Ozev (IEEE Des. Test, 2019)

Contact-Less Near-Field Test of Active Integrated RF Phased Array Antennas. - Maryam Shafiee; Sule Ozev (J. Electron. Test., 2019)

Knowledge- and Simulation-Based Synthesis of Area-Efficient Passive Loop Filter Incremental Zoom-ADC for Built-In Self-Test Applications. - Osman Emir Erol; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2019)

Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements. - Yanjun Li; Ender Yilmaz; Pete Sarson; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2019)

Digital Defect Based Built-in Self-Test for Low Dropout Voltage Regulators. - Mehmet Ince; Sule Ozev (ETS, 2020)

A Crowd-Based Explosive Detection System with Two-Level Feedback Sensor Calibration. - Chengmo Yang; Patrick Cronin; Agamyrat Agambayev; Sule Ozev; A. Enis Çetin; Alex Orailoglu (ICCAD, 2020)

Design Optimization for N-port RF Network Reflectometers under Noise and Gain Imperfections. - Muslum Emir Avci; Sule Ozev (ITC, 2020)

Enabling Large-scale Fine-grained Simulation of IED Vapor Concentration in Open-air Environments. - Agamyrat Agambayev; Christopher Lue Sang; Jennifer Blain Christen; Sule Ozev (MWSCAS, 2020)

Self-Interference Signal Path Characterization in Full-Duplex Transceivers Using Built-in Self-Test. - Debatrayee Roychowdhury; Soroush Moallemi; Sule Ozev; Jennifer Kitchen (RWS, 2020)

Determining Mechanical Stress Testing Parameters for FHE Designs with Low Computational Overhead. - Ganapati Bhat; Hang Gao; Sumit K. Mandal; Ümit Y. Ogras; Sule Ozev (IEEE Des. Test, 2020)

Self-Powered Wearable IoT Devices for Health and Activity Monitoring. - Ganapati Bhat; Ujjwal Gupta; Yigit Tuncel; Fatih Karabacak; Sule Ozev; Ümit Y. Ogras (Found. Trends Electron. Des. Autom., 2020)

Energy-Efficient Image Recognition System for Marine Life. - H. Seckin Demir; Jennifer Blain Christen; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

A Reconfigurable 0.1-10 MHz DT Passive Dynamic Zoom ADC for Cellular Receivers. - Osman Emir Erol; Sule Ozev (IEEE Trans. Circuits Syst. I Regul. Pap., 2020)

In-Field Recovery of RF Circuits from Wearout Based Performance Degradation. - Doohwang Chang; Jennifer N. Kitchen; Sayfe Kiaei; Sule Ozev (IEEE Trans. Emerg. Top. Comput., 2020)

Discrete Cosine Transform Based Causal Convolutional Neural Network for Drift Compensation in Chemical Sensors. - Diaa Badawi; Agamyrat Agambayev; Sule Ozev; A. Enis Çetin (ICASSP, 2021)

Background Receiver IQ Imbalance Correction for in-Field and Post-Production Testing and Calibration. - Muslum Emir Avci; Sule Ozev (ITC, 2021)

Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration. - Ishaan Bassi; Sule Ozev; Doohwang Chang (VTS, 2021)

Malicious Activity Detection in Lightweight Wearable and IoT Devices Using Signal Stitching. - Fatih Karabacak; Ümit Y. Ogras; Sule Ozev (Sensors, 2021)

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. - Mehmet Ince; Ender Yilmaz; Wei Fu; Joonsung Park; Krishnaswamy Nagaraj; LeRoy Winemberg; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2021)

Guaranteed Activation of Capacitive Trojan Triggers During Post Production Test via Supply Pulsing. - Bora Bilgic; Sule Ozev (DATE, 2022)

Detecting Anomaly in Chemical Sensors via Regularized Contrastive Learning. - Diaa Badawi; Ishaan Bassi; Sule Ozev; Ahmet Enis Çetin (ICASSP, 2022)

Fast RF Mismatch Calibration Using Built-in Detectors. - Muslum Emir Avci; Sule Ozev; Y. B. Chethan Kumar (VTS, 2022)

Performance Degradation Monitoring for Analog Circuits Using Lightweight Built-in Components. - Bora Bilgic; Sule Ozev (VTS, 2022)

Exploring Model-based Failure Prediction of Passive Bio-electro-mechanical Implants. - Daniel W. Gulick; Yuna Jung; Seunghyun Lee; Sule Ozev; Jennifer Blain Christen (VTS, 2022)

Digital Fault-based Built-in Self-test and Evaluation of Low Dropout Voltage Regulators. - Mehmet Ince; Bora Bilgic; Sule Ozev (ACM J. Emerg. Technol. Comput. Syst., 2022)

An In-Field Programmable Adaptive CMOS LNA for Intelligent IoT Sensor Node Applications. - Maryam Shafiee; Sule Ozev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Global Tuning for System Performance Optimization of RF MIMO Radars. - Ferhat Can Ataman; Muslum Emir Avci; Y. B. Chethan Kumar; Sule Ozev (ETS, 2023)

Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors. - Ferhat Can Ataman; Mohammed Aladsani; Georgios Trichopoulos 002; Y. B. Chethan Kumar; Sule Ozev (ETS, 2023)

Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars. - Ferhat Can Ataman; Y. B. Chethan Kumar; Sandeep Rao; Sule Ozev (ITC, 2023)

A Low Cost Physical Stimulus Emulator for Motion and Pressure Sensors. - Ishaan Bassi; Sule Ozev (MWSCAS, 2023)

IMPRoVED: Integrated Method to Predict PostRouting setup Violations in Early Design Stages. - Suhas Krishna Kashyap; Sule Ozev (ACM Trans. Design Autom. Electr. Syst., 2023)

Low-Cost Structural Monitoring of Analog Circuits for Secure and Reliable Operation. - Bora Bilgic; Sule Ozev (IEEE Des. Test, 2023)

Hierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling. - Tolga Aksoy; Nikhil Sagar Modala; Lakshmanan Balasubramanian; Rubin A. Parekhji; Sule Ozev (ETS, 2024)

Underwater Image Restoration Using Light Attenuation. - Huseyin Seckin Demir; Jennifer Blain Christen; Sule Ozev (ISVC (2), 2024)

Evaluating the Impact of Dehazing Algorithms on Visual Object Tracking Performance. - Huseyin Seckin Demir; Noah Rajbharti; Sloan Sciarappo; Jennifer Blain Christen; Sule Ozev (ISVC (1), 2024)

Electrical Stimulus Based Calibration of MEMS Accelerometer. - Ishaan Bassi; Sule Ozev (ITC, 2024)

Increasing the Efficiency of Hierarchical Fault Simulation through Functional Fault Clustering. - Nikhil Sagar Modala; Lakshmanan Balasubramanian; Rubin A. Parekhji; Sule Ozev (MWSCAS, 2024)

Multi-Parameter Optimization of mm-Wave Antenna Layout Using Hybrid Modeling and Incremental Model Learning. - Ferhat Can Ataman; Mohammed Aladsani; Y. B. Chethan Kumar; Georgios Trichopoulos 002; Sule Ozev (VTS, 2024)

Calibration and Source Localization Using an Array of Resistive Metal Oxide Gas Sensors. - Ishaan Bassi; Sule Ozev (VTS, 2024)

Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors. - Suhas Krishna Kashyap; Chinmaye Raghavendra; Suriyaprakash Natarajan; Sule Ozev (VTS, 2024)

DC Stimulus Electrical Calibration of MEMS Accelerometers. - Ishaan Bassi; Sule Ozev (VTS, 2025)

Defect Severity Analysis for Analog Circuits Using Zoom Search and Hierarchical Fault Simulation. - Mehmet Onder; Lakshmanan Balasubramanian; Rubin A. Parekhji; Suriyaprakash Natarajan; Sule Ozev (VTS, 2025)

A Multi-Step Algorithm to Increase Measurement Accuracy of mm-Wave BIST Using Periodic Structures. - Noah Rajbharti; Esteban Chacon; Muslum Emir Avci; Jennifer Kitchen; Sule Ozev (VTS, 2025)

Background Receiver IQ Imbalance Correction for In-Field Testing. - Muslum Emir Avci; Sule Ozev (IEEE Des. Test, 2025)