Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties. - Lauren Hoang; Alwin Daus; Sumaiya Wahid; Jimin Kwon; Jung-Soo Ko; Shengjun Qin; Mahnaz Islam; Krishna C. Saraswat; H.-S. Philip Wong; Eric Pop (DRC, 2022)

First Demonstration of Top-Gated ITO Transistors: Effect of Channel Passivation. - Sumaiya Wahid; Alwin Daus; Jimin Kwon; Shengjun Qin; Jung-Soo Ko; Krishna C. Saraswat; H.-S. Philip Wong; Eric Pop (DRC, 2022)

Up to 100-fold Improvement of Threshold Voltage Stability in ITO Transistors. - Sumaiya Wahid; Lauren Hoang; Alwin Daus; Eric Pop (DRC, 2023)

Co-designed Capacitive Coupling-Immune Sensing Scheme for Indium-Tin-Oxide (ITO) 2T Gain Cell Operating at Positive Voltage Below 2 V. - Kasidit Toprasertpong; Shuhan Liu; Jian Chen; Sumaiya Wahid; Koustav Jana; Wei-Chen Chen; Shengman Li; Eric Pop; H.-S. Philip Wong (VLSI Technology and Circuits, 2023)

Oxygen Engineering for Positive Bias Stress Stability of Top-Gated Indium Tin Oxide (ITO) Transistors. - Sumaiya Wahid; Eric Pop (DRC, 2024)