Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. - Summer F. C. Tseng; Wei-Ting Kary Chien; Bing-Chu Cai (Microelectron. Reliab., 2003)

A cost-effective wafer-level reliability test system for integrated circuit makers. - Summer Fan-Chung Tseng; Wei-Ting Kary Chien; Excimer Gong; Bing-Chu Cai (IEEE Trans. Instrum. Meas., 2003)

Some practical considerations for effective and efficient wafer-level reliability control. - Summer F. C. Tseng; Wei-Ting Kary Chien; Excimer Gong; Willings Wang; Bing-Chu Cai (Microelectron. Reliab., 2004)