Multi-CoDec Configurations for Low Power and High Quality Scan Test. - Arvind Jain; Sundarrajan Subramanian; Rubin A. Parekhji; Srivaths Ravi 001 (VLSI Design, 2011)

Design Techniques with Multiple Scan Compression CoDecs for Low Power and High Quality Scan Test. - Arvind Jain; Sundarrajan Subramanian; Rubin A. Parekhji; Srivaths Ravi 001 (J. Low Power Electron., 2011)