Register pointer architecture for efficient embedded processors. - JongSoo Park; Sung-Boem Park; James D. Balfour; David Black-Schaffer; Christos Kozyrakis; William J. Dally (DATE, 2007)

IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors. - Sung-Boem Park; Subhasish Mitra (DAC, 2008)

IFRA: Post-silicon bug localization in processors. - Sung-Boem Park; Subhasish Mitra (HLDVT, 2009)

Post-Silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA). - Sung-Boem Park; Ted Hong; Subhasish Mitra (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Synthesis and Optimization of 2D Filter Designs for Heterogeneous FPGAs. - Christos-Savvas Bouganis; Sung-Boem Park; George A. Constantinides; Peter Y. K. Cheung (ACM Trans. Reconfigurable Technol. Syst., 2009)

BLoG: post-silicon bug localization in processors using bug localization graphs. - Sung-Boem Park; Anne Bracy; Hong Wang 003; Subhasish Mitra (DAC, 2010)

QED: Quick Error Detection tests for effective post-silicon validation. - Ted Hong; Yanjing Li; Sung-Boem Park; Diana Mui; David Lin; Ziyad Abdel Kaleq; Nagib Hakim; Helia Naeimi; Donald S. Gardner; Subhasish Mitra (ITC, 2010)

Post-silicon bug localization for processors using IFRA. - Sung-Boem Park; Subhasish Mitra (Commun. ACM, 2010)

Robust System Design. - Subhasish Mitra; Hyungmin Cho; Ted Hong; Young Moon Kim; Hsiao-Heng Lee; Larkhoon Leem; Yanjing Li; David Lin; Evelyn Mintarno; Diana Mui; Sung-Boem Park; Nishant Patil; et al. (IPSJ Trans. Syst. LSI Des. Methodol., 2011)

Comparative study of test generation methods for simulation accelerators. - Wisam Kadry; Dmitry Krestyashyn; Arkadiy Morgenshtein; Amir Nahir; Vitali Sokhin; Jin Sung Park; Sung-Boem Park; Wookyeong Jeong; Jae-Cheol Son (DATE, 2015)

Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms. - Wisam Kadry; Dmitry Krestyashyn; Arkadiy Morgenshtein; Amir Nahir; Vitali Sokhin; Jin Sung Park; Sung-Boem Park; Wookyeong Jeong; Jae-Cheol Son (IEEE Des. Test, 2017)