Predicting Vt mean and variance from parallel Id measurement with model-fitting technique. - Chih-Ying Tsai; Kao-Chi Lee; Chien-Hsueh Lin; Sung-Chu Yu; Wen-Rong Liau; Alex Chun-Liang Hou; Ying-Yen Chen; Chun-Yi Kuo; Jih-Nung Lee; Mango C.-T. Chao (VTS, 2016)

A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement. - Chien-Hsueh Lin; Chih-Ying Tsai; Kao-Chi Lee; Sung-Chu Yu; Wen-Rong Liau; Alex Chun-Liang Hou; Ying-Yen Chen; Chun-Yi Kuo; Jih-Nung Lee; Mango C.-T. Chao (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)