Accelerated life test of high power white light emitting diodes based on package failure mechanisms. - Sung-Il Chan; W. S. Hong; K. T. Kim; Yang Gi Yoon; J. H. Han; Joong Soon Jang (Microelectron. Reliab., 2011)

Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection. - Wonwook Oh; Junhee Kim; Byungjun Kang; Soo Hyun Bae; Kyung Dong Lee; Hae-Seok Lee; Donghwan Kim; Sung-Il Chan (Microelectron. Reliab., 2016)

Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data. - Wonwook Oh; Soo Hyun Bae; Sung-Il Chan; Hae-Seok Lee; Donghwan Kim; Nochang Park (Microelectron. Reliab., 2017)

Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. - Dongshin Kim 004; Ju-Hwan Choi; Nochang Park; Sung-Il Chan; Yongchae Jeong (Microelectron. Reliab., 2018)