Selective-run built-in self-test using an embedded processor. - Sungbae Hwang; Jacob A. Abraham (ACM Great Lakes Symposium on VLSI, 2002)

Optimal BIST Using an Embedded Microprocessor. - Sungbae Hwang; Jacob A. Abraham (ITC, 2002)

Efficient loop-back testing of on-chip ADCs and DACs. - Hak-soo Yu; Jacob A. Abraham; Sungbae Hwang; Jeongjin Roh (ASP-DAC, 2003)

DSP-Based Statistical Self Test of On-Chip Converters. - Hak-soo Yu; Sungbae Hwang; Jacob A. Abraham (VTS, 2003)

Test data compression and test time reduction using an embedded microprocessor. - Sungbae Hwang; Jacob A. Abraham (IEEE Trans. Very Large Scale Integr. Syst., 2003)

Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip. - Robert F. Molyneaux; Thomas A. Ziaja; Hong Kim; Shahryar Aryani; Sungbae Hwang; Alex Hsieh (ITC, 2007)