ICA+OPCA for artifact-robust classification of EEG data. - Sungcheol Park; Hyekyoung Lee; Seungjin Choi (NNSP, 2003)

An implementation case for the performance appraisal and promotion ranking. - Chiung Moon; Joosung Lee; Chanseok Jeong; Jin Lee; Sungcheol Park; Si-Yeong Lim (SMC, 2007)

Advanced safety test solution for automotive SoC based on In-System-Test architecture. - Sangsoon Im; Giha Nam; Sungcheol Park; Mijung Noh (ISCAS, 2022)

A 4nm 1.15TB/s HBM3 Interface with Resistor-Tuned Offset-Calibration and In-Situ Margin-Detection. - Kwanyeob Chae; Jiyeon Park; Jaegeun Song; Billy Koo; Jihun Oh; Shinyoung Yi 002; Won Lee; Dongha Kim; Taekyung Yeo; Kyeongkeun Kang; Sangsoo Park; Eunsu Kim; et al. (ISSCC, 2023)

A 4-nm 1.15 TB/s HBM3 Interface With Resistor-Tuned Offset Calibration and In Situ Margin Detection. - Kwanyeob Chae; Jaegeun Song; Yoonjae Choi; Jiyeon Park; Billy Koo; Jihun Oh; Shinyoung Yi 002; Won Lee; Dongha Kim; Kyeongkeun Kang; Eunsu Kim; Juyoung Kim; et al. (IEEE J. Solid State Circuits, 2024)