A New Maximal Diagnosis Algorithm for Bus-structured Systems. - YongJoon Kim; DongSub Song; YongSeung Shin; Sunghoon Chun; Sungho Kang 001 (ITC, 2003)

RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. - Jung-Been Im; Sunghoon Chun; Geunbae Kim; Jin-Ho Ahn; Sungho Kang 001 (Asian Test Symposium, 2004)

An Efficient Dictionary Organization for Maximum Diagnosis. - Sunghoon Chun; Sangwook Kim; Hong-Sik Kim; Sungho Kang 001 (J. Electron. Test., 2006)

MICRO: a new hybrid test data compression/decompression scheme. - Sunghoon Chun; YongJoon Kim; Jung-Been Im; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2006)

High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects. - Sunghoon Chun; YongJoon Kim; Sungho Kang 001 (ATS, 2007)

MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. - Sunghoon Chun; YongJoon Kim; Sungho Kang 001 (J. Electron. Test., 2007)

A new low energy BIST using a statistical code. - Sunghoon Chun; Taejin Kim; Sungho Kang (ASP-DAC, 2008)

XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. - Sunghoon Chun; YongJoon Kim; Taejin Kim; Myung-Hoon Yang; Sungho Kang 001 (ATS, 2008)

An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme. - Taejin Kim; Sunghoon Chun; YongJoon Kim; Myung-Hoon Yang; Sungho Kang 001 (ATS, 2008)

A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. - Junghyun Nam; Sunghoon Chun; Gibum Koo; Yanggi Kim; Byungsoo Moon; Jonghyoung Lim; Jaehoon Joo; Sangseok Kang; Hoonjung Kim; Kyeongseon Shin; Kisang Kang; Sungho Kang (ITC, 2008)

An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. - Sunghoon Chun; Taejin Kim; YongJoon Kim; Sungho Kang 001 (VTS, 2008)

An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. - Myung-Hoon Yang; YongJoon Kim; Sunghoon Chun; Sungho Kang 001 (J. Electron. Test., 2008)

A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. - Sunghoon Chun; YongJoon Kim; Taejin Kim; Sungho Kang 001 (VTS, 2009)

ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults. - Sunghoon Chun; Taejin Kim; Sungho Kang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

DiSC: A New Diagnosis Method for Multiple Scan Chain Failures. - Sunghoon Chun; Alex Orailoglu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)