Investigation on multiple activation energy of retention in charge trapping memory using self-consistent simulation. - Sangyong Park; Seongwook Choi; Kwang Sun Jun; HuiJung Kim; SungMan Rhee; Young June Park (ESSDERC, 2014)

Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk. - SungMan Rhee; Hyunjin Kim; Sangku Park; Taiki Uemura; Yuchul Hwang; Seungjin Choo; Jinju Kim; Hwasung Rhee; Shin-Young Chung (IRPS, 2023)

V-Ramp VBD Prediction Method Using OCD-Spectrum and Deep-Learning, and Application to Early Detection of V-NAND Low Metal Reliability Risk. - SungMan Rhee; Sung-Pyo Park; Sangku Park; Yuchul Hwang; Sangwoo Pae; Jun Meng; Yoonju Park (IRPS, 2024)