Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices. - Soonyoung Lee; Ilgon Kim; Sungmock Ha; Cheong-sik Yu; Jinhyun Noh; Sangwoo Pae; Jongwoo Park 001 (IRPS, 2015)

Reliability Characterization of HBM featuring $ text{HK}+ text{MG}$ Logic Chip with Multi-stacked DRAMs. - Sungmock Ha; S. Lee; G. H. Bae; D. S. Lee; S. H. Kim; B. W. Woo; N.-H. Lee; Y. S. Lee; S. Pae (IRPS, 2023)