A 12-bit 8GS/s RF Sampling DAC with Code-Dependent Nonlinearity Compensation and Intersegmental Current-Mismatch Calibration in 5nm FinFET. - Byeongwoo Koo; Sunghan Do; Sang-Pil Nam; Heewook Shin; Sungno Lee; Eunhye Oh; Jaemin Hong; Jung-Ho Lee; Youngjae Cho; Michael Choi; Jongshin Shin (VLSI Technology and Circuits, 2022)

An Automotive ASIL-D Safety Mechanism in ADC and DAC for Communication Application. - Kyung-Hoon Lee; Jinwoo Park; Younghyo Park; Byeongwoo Koo; Sunghan Do; Woongtaek Lim; Sungno Lee; Hyochul Shin; Eunhye Oh; Youngjae Cho; Michael Choi; Jongshin Shin (VLSI Technology and Circuits, 2022)

A 12-bit 16GS/s Single-Channel RF-DAC with Hybrid Segmentation for Digital Back-Off and Code-Dependent Free Switch Driver Achieving -85dBc IMD3 in 5nm FinFET. - Byeongwoo Koo; Sunghan Do; Sangkyu Lee; Sang-Pil Nam; Heewook Shin; Saemin Im; Hyochul Shin; Sungno Lee; Junsang Park; Jungho Lee; Youngjae Cho; Michael Choi; et al. (VLSI Technology and Circuits, 2024)

A 12-bit 10GS/s Time-Interleaved SAR ADC with Even/Odd Channel-Correlated Absolute Error-Based Over-Nyquist Timing-Skew Calibration in 5nm FinFET. - Junsang Park; Jinwoo Park; Jaemin Hong; Sun-Jae Park; Dongsuk Lee; Sungno Lee; Hyochul Shin; Kyung-Hoon Lee; Byeongwoo Koo; Youngjae Cho; Michael Choi; Jongshin Shin (VLSI Technology and Circuits, 2024)