Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter. - David C. Keezer; Te-Hui Chen; Carl Edward Gray; Hyun Woo Choi; Sungyeol Kim; Seongkwan Lee; Hosun Yoo (ITC, 2012)

An FPGA-based ATE extension module for low-cost multi-GHz memory test. - David C. Keezer; Te-Hui Chen; Thomas Moon; D. T. Stonecypher; Abhijit Chatterjee; Hyun Woo Choi; Sungyeol Kim; Hosun Yoo (ETS, 2015)

PaTran: Translation Platform for Test Pattern Program. - Jung-Geun Park; Minsu Kim; Soo-Mook Moon; Sungyeol Kim; Insu Yang; Hyunsoo Jung (ETS, 2019)

Output-based Intermediate Representation for Translation of Test-pattern Program. - Minsu Kim; Jeong-Keun Park; Sungyeol Kim; Insu Yang; Hyunsoo Jung; Soo-Mook Moon (ACM Trans. Embed. Comput. Syst., 2019)