Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. - Sungyoul Seo; Yong Lee 002; Hyeonchan Lim; Joohwan Lee; Hongbom Yoo; Yojoung Kim; Sungho Kang 001 (ATS, 2015)

Low power scan bypass technique with test data reduction. - Hyunyul Lim; Wooheon Kang; Sungyoul Seo; Yong Lee 002; Sungho Kang 001 (ISQED, 2015)

A scan shifting method based on clock gating of multiple groups for low power scan testing. - Sungyoul Seo; Yong Lee 002; Joohwan Lee; Sungho Kang 001 (ISQED, 2015)

Software-based embedded core test using multi-polynomial for test data reduction. - Soyeon Kang; Inhyuk Choi; Hyeonchan Lim; Sungyoul Seo; Sungho Kang 001 (ISOCC, 2016)

A test methodology to screen scan-path failures. - Junghwan Kim; Young-Woo Lee; Minho Cheong; Sungyoul Seo; Sungho Kang 001 (ISOCC, 2016)

Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression. - Sungyoul Seo; Yong Lee 002; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

An efficient built-in self-repair scheme for area reduction. - Keewon Cho; Young-Woo Lee; Sungyoul Seo; Sungho Kang 001 (ISOCC, 2017)

Broadcast scan compression based on deterministic pattern generation algorithm. - Hyeonchan Lim; Sungyoul Seo; Soyeon Kang; Sungho Kang 001 (ISQED, 2017)

Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. - Sungyoul Seo; Hyeonchan Lim; Soyeon Kang; Sungho Kang 001 (ISQED, 2017)

2-D Failure Bitmap Compression Using Line Fault Marking Method. - Keewon Cho; Young-Woo Lee; Sungyoul Seo; Sungho Kang 001 (ISOCC, 2018)

A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. - Sungyoul Seo; Keewon Cho; Young-Woo Lee; Sungho Kang 001 (IEEE J. Emerg. Sel. Topics Circuits Syst., 2018)

An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults. - Keewon Cho; Young-Woo Lee; Sungyoul Seo; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

Reduced-Pin-Count BOST for Test-Cost Reduction. - Youngkwang Lee; Young-Woo Lee; Sungyoul Seo; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)